Veranstaltungsdaten

Beschreibung: In this course the basic principles of Atomic Force Microscopy (AFM) will be taught using different instruments available in our labs. We will show how this technique can be utilized in a number of current research questions. Furthermore, different techniques for the determination of material properties by force spectroscopic measurements will be shown.

The participants will have the chance to operate the instruments by themselves and we encourage the participants to bring their own samples (in this case, please contact us about a week in advance, so we can make sure we can accommodate the sample in question.)

Important:

Once participation has become binding after the signing-out period, cancellation is only possible via the GGNB or GAUSS Office with a) sick certificate, or b) statement by supervisor for scientific reasons. If you do not provide this, you will be excluded from courses for the next 12 months, as well as travel grants and other financial support. No exceptions.

By signing up you agree (1) to carefully check whether you will be able to attend the course (do not register for 2 courses taking place on the same dates - the above mentioned sanctions apply!), (2) to frequently check your student e-mail account, as all information on courses will exclusively be sent to that account; (3) that your name and e-mail address may be forwarded to the course instructor(s) for communication before and after the course; (4) to complete the course evaluation; (5) inform us if you no longer wish to maintain a waiting list position; (6) that you only receive credits for attending the entire workshop - you will not get partial credits for part-time attendance.